Abstract—This paper presents a novel scheme to address the challenge of identifying failing scan cells from production test responses in the presence of scan compression.
I. INTRODUCTION
Failing scan cell data collected from scan-based de-signs has successfully been used for many years to help identify systematic yield issues.
In principle, diagnostic algorithms are classified ac-cording to response compaction schemes they rest on.
(p1 col 2)
A common approach is to re-run test in order to diag-nose more accurately a larger number of scan errors.
